These products (the LSCT series cryogenic transfer systems, IMP120 multi-beam ion milling system, and HSC series ion beam etching/coating/milling systems) are all auxiliary devices designed for use with electron microscopes (EM). They are mainly applied to sample pretreatment and in-situ or cryogenic transfer and observation, meeting the stringent requirements of advanced electron microscopy analysis in terms of sample state preservation, surface quality, and structural fidelity.
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